Diffractive triangulation of radiative point sources

TL;DR

This paper introduces a novel diffraction-based triangulation method using crystalline sensors to precisely locate wave sources relative to pixel detectors, enabling improved calibration in electron microscopy.

Contribution

It presents a new general approach leveraging detector diffraction patterns for source localization, applicable to calibrating Kikuchi diffraction in SEMs.

Findings

Successfully localized electron sources using diffraction patterns

Enhanced accuracy in microstructural measurements

Applicable to various wave-based source localization tasks

Abstract

We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.