Spin Coated Multilayered Cupric Oxide Thin Films and their structural properties

TL;DR

This study used sol-gel spin coating to create multilayered CuO thin films, analyzing their structural properties and crystallization behavior at various annealing temperatures, revealing increased crystallite size with higher temperatures.

Contribution

It demonstrates a method to synthesize multilayered CuO thin films and characterizes their structural evolution with temperature using XRD and FTIR.

Findings

Crystallization of CuO confirmed above 350°C

Crystallite size increases from 0.801 to 55.2 Å with temperature

Multi-layered films successfully fabricated and characterized

Abstract

Sol-gel spin coating technique was employed to synthesize CuO thin films at 1500 rpm, 2200 rpm and 2400 rpm for 30 seconds, and subsequently annealed at 150-550{\deg}C for 1 hour. Multi-layered CuO thin films with 3 and 5 layers were prepared. These thin films were characterized using XRD, FTIR and polarizing light microscopy. The XRD and FTIR analysis confirmed the crystallization of CuO phase in thin films annealed above 350 {\deg}C, and corresponding crystallite sizes were observed to be increasing with the annealing temperature. The Scherrer formula was applied for (111) and peaks of XRD patterns of CuO thin films. According to the data of peak, average crystallite size increased from 0.801 to 55.2 0A as annealing temperature was increased from 350 to 500 0C.