Energy-Reliability Limits in Nanoscale Feedforward Neural Networks and Formulas
Avhishek Chatterjee, Lav R. Varshney

TL;DR
This paper investigates the fundamental energy-reliability limits of nanoscale neural networks and formulas, extending mutual information techniques to derive practical energy bounds for different circuit technologies.
Contribution
It introduces an extended mutual information propagation method and a linear-time algorithm to compute energy lower bounds for noisy circuits with heterogeneous gates.
Findings
Energy scales superlinearly with inputs in uniform gate circuits.
Energy scales linearly with inputs in heterogeneous gate circuits.
Practical algorithm for energy bounds in complex circuit designs.
Abstract
Due to energy-efficiency requirements, computational systems are now being implemented using noisy nanoscale semiconductor devices whose reliability depends on energy consumed. We study circuit-level energy-reliability limits for deep feedforward neural networks (multilayer perceptrons) built using such devices, and en route also establish the same limits for formulas (boolean tree-structured circuits). To obtain energy lower bounds, we extend Pippenger's mutual information propagation technique for characterizing the complexity of noisy circuits, since small circuit complexity need not imply low energy. Many device technologies require all gates to have the same electrical operating point; in circuits of such uniform gates, we show that the minimum energy required to achieve any non-trivial reliability scales superlinearly with the number of inputs. Circuits implemented in emerging…
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