Detection of Electromagnetic Inclusions using Topological Sensitivity

TL;DR

This paper introduces a topological sensitivity method for detecting small electromagnetic inclusions using far field measurements, analyzing its resolution, stability, and noise robustness through theoretical and numerical studies.

Contribution

It develops a new topological sensitivity framework for electromagnetic inclusion detection, considering multiple measurement scenarios and noise stability analysis.

Findings

The method achieves high resolution in locating small inclusions.

The framework is stable against measurement and medium noises.

Numerical results demonstrate effective detection with single and multiple measurements.

Abstract

In this article a topological sensitivity framework for far field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.