Opto-Electronic Characterization of Three Dimensional Topological Insulators

TL;DR

This paper introduces a terahertz/infrared photogalvanic technique to analyze high-frequency surface conductivity and inhomogeneities in 3D topological insulators, effective at room temperature and in high bulk carrier density materials.

Contribution

It presents a novel method using photogalvanic effects to probe surface states and inhomogeneities in 3D topological insulators at room temperature.

Findings

Effective at room temperature

Sensitive to surface symmetry and scattering

Can detect topographical inhomogeneities

Abstract

We demonstrate that the terahertz/infrared radiation induced photogalvanic effect, which is sensitive to the surface symmetry and scattering details, can be applied to study the high frequency conductivity of the surface states in (Bi1-xSbx)2Te3 based three dimensional (3D) topological insulators (TI). In particular, measuring the polarization dependence of the photogalvanic current and scanning with a micrometre sized beam spot across the sample, provides access to (i) topographical inhomogeneity's in the electronic properties of the surface states and (ii) the local domain orientation. An important advantage of the proposed method is that it can be applied to study TIs at room temperature and even in materials with a high electron density of bulk carriers.