Metallized Film Capacitor Lifetime Evaluation and Failure Mode Analysis
R. Gallay (Garmanage, Farvagny-le-Petit, Switzerland)
TL;DR
This paper reviews methods for predicting the lifetime of metallized film capacitors in power electronics, focusing on failure modes and statistical models to estimate remaining operational time.
Contribution
It introduces a comprehensive analysis of failure modes and applies Weibull statistics with acceleration factors for lifetime prediction.
Findings
Failure modes significantly impact capacitor lifespan
Weibull law effectively models failure probability
Environmental factors accelerate degradation
Abstract
One of the main concerns for power electronic engineers regarding capacitors is to predict their remaining lifetime in order to anticipate costly failures or system unavailability. This may be achieved using a Weibull statistical law combined with acceleration factors for the temperature, the voltage, and the humidity. This paper discusses the different capacitor failure modes and their effects and consequences.
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Taxonomy
TopicsHigh voltage insulation and dielectric phenomena · Power Transformer Diagnostics and Insulation · Magnetic Properties and Applications