Set-up of a High-Resolution 300 mK Atomic Force Microscope in an Ultra-High Vacuum Compatible 3He/10T Cryostat

TL;DR

This paper presents the design and implementation of a high-resolution atomic force microscope capable of atomic resolution at around 500 mK within an ultra-high vacuum environment, integrated with a 3He/10T cryostat.

Contribution

It introduces a novel all-fiber interferometric detection scheme and a versatile cryostat setup allowing in-situ tip/sample exchange and atomic resolution at very low temperatures.

Findings

Resolved single Co atoms on Mn/W(110)

Achieved atomic resolution on NaCl(001)

Demonstrated low-temperature performance

Abstract

The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where tip and sample can be exchanged in-situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).