Dielectric relaxation and crystallization behaviour of amorphous nilutamide
N. S. K. Kumar, G. Govindaraj, U. Sailaja

TL;DR
This study investigates the dielectric relaxation and crystallization behavior of amorphous nilutamide, revealing its molecular mobility, secondary relaxation as Johari-Goldstein process, and crystallization kinetics.
Contribution
It provides detailed dielectric analysis of nilutamide's relaxation processes and crystallization behavior, including identification of JG β-relaxation and crystallization parameters.
Findings
Nilutamide exhibits non-Arrhenius α-relaxation following VFT behavior.
Secondary relaxation is identified as Johari-Goldstein β-process.
Crystallization follows Avrami kinetics with specific parameters.
Abstract
The molecular mobility of glass and supercooled liquid states of nilutamide has been studied with broadband dielectric spectroscopy for a wide range of temperature and frequency. Besides primary -relaxation an excess wing like secondary relaxation is observed. The temperature dependence of structural -relaxation show non-Arrhenius behaviour, and follows Vogel-Fulcher-Tammann (VFT) empirical formula. The glass transition temperature, T=302K and fragility index, m=76 are obtained from the VFT parameters. The structural -relaxation process is non-Debye with Kohlraush-Williams-Watts stretched exponential =0.76. Secondary relaxation time of nilutamide coincides with the primitive relaxation time calculated from the coupling model. Hence the secondary relaxation process of nilutamide is treated as the Johari-Goldstein (JG) -process, which is…
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Taxonomy
TopicsMaterial Dynamics and Properties · Solid-state spectroscopy and crystallography · Thermodynamic properties of mixtures
