Experimentally derived axial stress- strain relations for two-dimensional materials such as monolayer graphene

TL;DR

This paper introduces a Raman spectroscopy-based method to directly derive true axial stress-strain relations for monolayer graphene, simplifying measurements without complex modeling or force calibration.

Contribution

It presents a novel experimental approach linking Raman peak shifts to stress in monolayer graphene, applicable across multiple scales including nanoscale.

Findings

Raman peak shift correlates linearly with Young's modulus in fibers.

The method accurately measures stress in monolayer graphene without force or area calibration.

The approach is valid from macro to nanoscale for 2D materials.

Abstract

A methodology is presented here for deriving true experimental axial stress-strain curves in both tension and compression for monolayer graphene through the shift of the 2D Raman peak that is present in all graphitic materials. The principle behind this approach is the observation that the shift of the 2D wavenumber as a function of strain for different types of PAN based fibres is a linear function of their Young's moduli and, hence, the corresponding value of the shift of the 2D Raman peak over axial stress is, in fact, a constant. By moving across the length scales we show that this value is also valid at the nanoscale as it corresponds to the in plane breathing mode of graphene that is present in both PAN based fibres and monolayer graphene. Hence, the values of the shift of the 2D Raman peak can be easily converted to values of stress in the linear elastic region without the aid of modelling or the need to resort to cumbersome experimental procedures for obtaining the axial force transmitted to the material and the cross sectional area of the two dimensional membrane.