Combined single crystal polarized XAFS and XRD at high pressure: probing the interplay between lattice distortions and electronic order at multiple length scales in high $T_c$ cuprates

TL;DR

This paper presents a combined polarized XAFS and XRD method at high pressure to study the relationship between lattice distortions and electronic order in high-temperature cuprates, revealing insights into their complex behavior.

Contribution

It introduces a novel experimental approach combining polarized XAFS and XRD at high pressure to analyze structural and electronic correlations at multiple length scales in cuprates.

Findings

Pressure affects electronic order in cuprates.

Structural distortions correlate with electronic properties.

Method enables multi-scale analysis of complex materials.

Abstract

Some of the most exotic material properties derive from electronic states with short correlation length (~10-500 {\AA}), suggesting that the local structural symmetry may play a relevant role in their behavior. Here we discuss the combined use of polarized x-ray absorption fine structure and x-ray diffraction at high pressure as a powerful method to tune and probe structural and electronic orders at multiple length scales. Besides addressing some of the technical challenges associated with such experiments, we illustrate this approach with results obtained in the cuprate La$_{1.875}$Ba$_{0.125}$CuO$_4$, in which the response of electronic order to pressure can only be understood by probing the structure at the relevant length scales.