Ferroelectric Domain Patterning Controlled Schottky Junction State in Monolayer MoS$_2$
Zhiyong Xiao, Jingfeng Song, David K. Ferry, Stephen Ducharme, Xia, Hong

TL;DR
This paper demonstrates how scanning probe controlled ferroelectric domain patterning can nonvolatily modulate the electronic states of monolayer MoS$_2$, enabling programmable Schottky junctions with potential applications in van der Waals heterostructures.
Contribution
It introduces a novel method of domain patterning to control Schottky junction states in monolayer MoS$_2$, revealing tunable barrier heights and insights into conduction mechanisms.
Findings
Schottky barrier height varies from 0.38 eV to 0.57 eV.
The modulation is tunable via a global back-gate.
Rectified I-V behavior is explained by thermionic emission.
Abstract
We exploit scanning probe controlled domain patterning in a ferroelectric top layer to induce nonvolatile modulation of the conduction characteristic of monolayer MoS between a transistor and a junction state. In the presence of a domain wall, MoS exhibits rectified I-V that is well described by the thermionic emission model. The induced Schottky barrier height varies from 0.38 eV to 0.57 eV and is tunabe by a SiO global back-gate, while the tuning range of depends sensitively on the conduction band tail trapping states. Our work points to a new route to achieving programmable functionalities in van der Waals materials and sheds light on the critical performance limiting factors in these hybrid systems.
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