Measurement of the charged pion mass using X-ray spectroscopy of exotic atoms
M Trassinelli (INSP), D.F. Anagnostopoulos (DMSE), G. Borchert (KFA),, A. Dax (PSI), J.P Egger, D. Gotta (KFA), M. Hennebach (KFA), P. Indelicato, (LKB (Jussieu)), Y.-W. Liu (PSI), B. Manil (LPL), N. Nelms, L.M. Simons, (PSI), A. Wells

TL;DR
This study precisely measured the charged pion mass using X-ray spectroscopy of exotic atoms, calibrating with muonic oxygen lines, and found a value slightly higher than the current world average.
Contribution
It introduces a novel high-precision measurement technique for the charged pion mass using simultaneous X-ray spectroscopy of pionic and muonic atoms.
Findings
Charged pion mass measured as 139.57077 MeV/c^2 with 1.3ppm precision.
The measured pion mass is 4.2ppm larger than the current world average.
Method provides a new benchmark for fundamental particle mass measurements.
Abstract
The transitions in pionic nitrogen and muonic oxygen were measured simultaneously by using a gaseous nitrogen-oxygen mixture at 1.4\,bar. Due to the precise knowledge of the muon mass the muonic line provides the energy calibration for the pionic transition. A value of (139.57077\,\,0.00018)\,MeV/c (\,1.3ppm) is derived for the mass of the negatively charged pion, which is 4.2ppm larger than the present world average.
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