Epitaxial rhenium microwave resonators
E Dumur (NEEL), B Delsol (SIMaP), T Wei{\ss}l (NEEL), B Kung (NEEL), W, Guichard (NEEL), C Hoarau (NEEL), C Naud (NEEL), K Hasselbach (NEEL), O, Buisson (NEEL), K Ratter (SIMaP), B Gilles (SIMaP)
TL;DR
This paper reports the fabrication and characterization of epitaxial rhenium microwave resonators, analyzing their resonance properties and extracting key superconducting parameters like penetration depths.
Contribution
It introduces a method to fabricate high-quality epitaxial rhenium resonators and measures their electromagnetic properties at low temperatures.
Findings
Resonance frequencies and quality factors were successfully measured.
Effective and London penetration depths were extracted from resonance data.
Structural quality of films affects resonator performance.
Abstract
We have fabricated rhenium microwave resonators from epitaxial films. We have used thin films of different structural quality depending on their growth conditions. The resonators were coupled to a microwave transmission line which allows the measurement of their resonance frequencies and internal quality factors. From the resonance frequency at low temperature , the effective penetration depth and the London penetration depth of the rhenium film are extracted.
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