An Anomalous Contrast of Insulators in Scanning Electron Microscope: The Split Image

TL;DR

This paper reports a novel anomalous contrast phenomenon called double imaging observed in scanning electron microscopy of insulators with a tungsten probe, analyzing its causes related to electric field effects.

Contribution

It introduces and analyzes a new contrast phenomenon in SEM imaging of insulators, highlighting the influence of the probe on internal electric fields.

Findings

Identification of double imaging phenomenon in SEM of insulators

Analysis of electric field influence on imaging contrast

Discussion of probe's role in contrast anomaly

Abstract

A novel phenomenon of anomalous contrast in scanning electron microscope when the instrument is used to observe an insulator specimen with a wolfram probe, we called double imaging, is reported in this article. We give a detail analysis of this phenomenon in its occurrence, and discuss the influence of the added probe to internal electric field which lead to the occurrence of double imaging.