Excitation and reception of pure shear horizontal waves by using face-shear d24 mode piezoelectric wafers
Hongchen Miao, Qiang Huan, Faxin Li

TL;DR
This paper demonstrates that face-shear d24 mode piezoelectric wafers can effectively excite and receive pure shear horizontal (SH0) waves in plates, offering improved non-destructive testing and structural health monitoring capabilities.
Contribution
It introduces a novel use of face-shear d24 mode piezoelectrics for efficient SH0 wave excitation and reception, with experimental and simulation validation.
Findings
Face-shear d24 piezoelectrics outperform thickness-shear in driving SH waves.
Pure SH0 waves are successfully excited and received over a wide frequency range.
The SH0 wave exhibits symmetrical excitation and maintains high amplitude within 30° deviation.
Abstract
The fundamental shear horizontal (SH0) wave in plate-like structures is of great importance in non-destructive testing (NDT) and structural health monitoring (SHM) as it is non-dispersive, while excitation and reception of SH0 waves using piezoelectrics is always a challenge. In this work, we firstly demonstrate via finite element simulations that face-shear piezoelectrics is superior to thickness-shear piezoelectrics in driving SH waves. Next, by using a newly defined face-shear d24 PZT wafer as actuator and face-shear d36 PMN-PT wafers as sensors, pure SH0 wave was successfully excited in an aluminum plate from 140 kHz to 190 kHz. Then, it was shown that the face-shear d24 PZT wafer could receive the SH0 wave only and filter the Lamb waves over a wide frequency range (120 kHz to 230 kHz). The directionality of the excited SH0 wave was also investigated using face-shear d24 PZT wafers…
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