A computationally assisted spectroscopic technique to measure secondary electron emission coefficients in radio frequency plasmas
M. Daksha, B. Berger, E. Schuengel, I. Korolov, A. Derzsi, M. Koepke,, Z. Donko, J. Schulze

TL;DR
This paper introduces a non-intrusive spectroscopic method combining optical emission spectroscopy and simulations to accurately measure secondary electron emission coefficients in radio-frequency plasmas.
Contribution
It presents a novel computationally assisted spectroscopic technique ($ ext{γ}$-CAST) for determining secondary electron emission coefficients in RF plasmas, enhancing measurement precision.
Findings
Effective measurement of $ ext{γ}$ in argon plasma.
Determined $ ext{γ}$ for stainless steel electrodes as 0.066 ± 0.01.
Method sensitive to excitation mechanisms near electrodes.
Abstract
A Computationally Assisted Spectroscopic Technique to measure secondary electron emission coefficients (-CAST) in capacitively-coupled radio-frequency plasmas is proposed. This non-intrusive, sensitive diagnostic is based on a combination of Phase Resolved Optical Emission Spectroscopy and particle-based kinetic simulations. In such plasmas (under most conditions in electropositive gases) the spatio-temporally resolved electron-impact excitation/ionization rate features two distinct maxima adjacent to each electrode at different times within each RF period. While one maximum is the consequence of the energy gain of electrons due to sheath expansion, the second maximum is produced by secondary electrons accelerated towards the plasma bulk by the sheath electric field at the time of maximum voltage drop across the adjacent sheath. Due to these different excitation/ionization…
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