Temperature and high fluence induced ripple rotation on Si(100) surface
Debasree Chowdhury, Biswarup Satpati, Debabrata Ghose

TL;DR
This study investigates how temperature and ion fluence influence ripple pattern rotation on Si(100) surfaces during ion beam sputtering, revealing temperature-dependent morphological transitions and a surprising orthogonal ripple rotation at high temperatures.
Contribution
It demonstrates the temperature-induced transition and rotation of ripple patterns on Si(100), combining experimental observations with theoretical models to advance understanding of pattern formation mechanisms.
Findings
Ripple patterns are stable at room temperature across fluences.
Elevated temperatures cause ripple pattern demolition into mound-like structures.
Above 400°C, ripple patterns rotate orthogonally at high fluences.
Abstract
Topography evolution of Si(100) surface due to oblique incidence low energy ion beam sputtering (IBS) is investigated. Experiments were carried out at different elevated temperatures from 20C to 450C and at each temperature, the ion fluence is systematically varied in a wide range from 110cm to 110cm. The ion sputtered surface morphologies are characterized by atomic force microscopy and high-resolution cross-sectional transmission electron microscopy. At room temperature, the ion sputtered surfaces show periodic ripple nanopatterns and their wave-vector remains parallel to ion beam projection for entire fluence range. With increase of substrate temperature, these patterns tend to demolish and reduce into randomly ordered mound-like structures around 350C. Further rise in temperature above 400C…
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