Calibration of higher eigenmodes of cantilevers
Aleksander Labuda, Marta Kocun, Tim Walsh, Jieh Meinhold, Tania, Proksch, Waiman Meinhold, Martin Lysy, Roger Proksch

TL;DR
This paper introduces a calibration method for higher eigenmodes of atomic force microscopy cantilevers that simplifies the process by using a power-law relationship and ratio measurements, verified through multiple approaches.
Contribution
It presents a novel calibration routine that determines higher-mode stiffnesses using a power-law relationship and ratio measurements, reducing calibration effort for similar cantilevers.
Findings
Power-law relationships for higher-mode stiffnesses are established.
The method is validated with interferometric, AC approach-curve, and finite element analysis.
Calibration of mode amplitudes is achieved via thermal spectrum analysis.
Abstract
A method is presented for calibrating the higher eigenmodes (resonance modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The method leverages recent efforts in accurately calibrating the first eigenmode by providing the higher-mode stiffness as a ratio to the first mode stiffness. A one-time calibration routine must be performed for every cantilever type to determine the power-law relationship between stiffness and frequency, which is then stored for future use on similar cantilevers. Then, future calibrations only require a measurement of the ratio of resonance frequencies and the stiffness of the first mode. This method is verified through stiffness measurements using three independent approaches: interferometric measurement, AC approach-curve calibration, and finite element analysis simulation. Power-law values for calibrating…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
