Fourier-transform Ghost Imaging with Hard X-rays
Hong Yu, Ronghua Lu, Shensheng Han, Honglan Xie, Guohao Du, Tiqiao, Xiao, Daming Zhu

TL;DR
This paper introduces a lensless Fourier-transform ghost imaging technique using pseudo-thermal hard X-rays, enabling atomic resolution imaging of non-crystalline samples without requiring highly coherent sources.
Contribution
The novel method extends X-ray imaging capabilities to non-crystalline samples and achieves atomic resolution without the need for highly coherent X-ray sources.
Findings
High-resolution diffraction patterns obtained in the Fresnel region
Successful retrieval of amplitude and phase distributions of samples
Method applicable with laboratory X-ray sources
Abstract
Knowledge gained through X-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. Atomic details of sample structures is achievable by X-ray crystallography, however, it is only applied to crystalline structures. Imaging techniques based on X-ray coherent diffraction or zone plates are capable of resolving the internal structure of non-crystalline materials at nanoscales, but it is still a challenge to achieve atomic resolution. Here we demonstrate a novel lensless Fourier-transform ghost imaging method with pseudo-thermal hard X-rays by measuring the second-order intensity correlation function of the light. We show that high resolution Fourier-transform diffraction pattern of a complex amplitude sample can be achieved at Fresnel region and the amplitude and phase distributions of a…
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