The test of the electronics system for the BESIII ETOF upgrade
Wang Xiaozhuang, Dai Hongliang, Wu Zhi, Heng Yuekun, Zhang Jie, Cao, Ping, Ji Xiaolu, Li Cheng, Sun Weijia, Wang Siyu, Wang Yun
TL;DR
This paper details the upgrade of the BESIII ETOF system using MRPC technology, including electronics testing and validation to ensure improved time resolution and system reliability.
Contribution
It introduces a new electronics system for the BESIII ETOF upgrade and verifies its performance through comprehensive testing and beam experiments.
Findings
Electronics system meets design time resolution of 80 ps
System passes heat, irradiation, and large-current tests
On-detector beam tests confirm reliability and stability
Abstract
It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with multi-gap resistive plate chamber (MRPC), aiming at overall time resolution about 80 ps. After the entire electronics system is ready, some experiments, such as heat radiating, irradiation hardness and large-current beam tests,are carried out to certify the electronics' reliability and stability. The on-detector test of the electronics is also performed with the beam at BEPCII E3 line, the test results indicate that the electronics system fulfills its design requirements.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsParticle Detector Development and Performance · Magnetic confinement fusion research · Particle Accelerators and Free-Electron Lasers