Inner-shell photodetachment from Si- negative ion: strong effect of many-electron correlations
Galina Schrange-Kashenock

TL;DR
This paper presents a detailed theoretical study of inner-shell photodetachment from Si- ions, emphasizing the critical role of many-electron correlations and dynamic relaxation effects in shaping the resonance structures and cross sections.
Contribution
It introduces a comprehensive RPAE&DEM approach for accurately modeling inner-shell photodetachment, highlighting the importance of many-electron correlations and dynamic relaxation effects.
Findings
Resonance structures are prominent near 2s and 2p thresholds.
Dynamic relaxation significantly influences resonance formation.
Total cross section dominated by a resonance peak after the 2s threshold.
Abstract
The first theoretical investigation on the inner-shell single-photodetachment from the Si- negative ion is presented. The partial and total cross sections, the photoelectron phaseshifts, and the parameters of angular anisotropy are calculated in the framework of Many-Body Theory for L-shell photodetachment from Si- ion in the experimentally accessible range of photon energies (7.5-14 Ry). Comparison is made between the calculations of the response of the ionic many-electron system Si- to an electromagnetic field at the different levels of approximation: the "frozen-field" Random Phase Approximation with Exchange (RPAE), and the static relaxation approximation. The optimal analysis is made when the dynamic relaxation and polarization are included within the Dyson Equation Method (DEM) simultaneously with the RPAE corrections (RPAE&DEM approach). It is predicted that the photoexcitation…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
