Cantilever detected ferromagnetic resonance in thin Fe$_{50}$Ni$_{50}$, Co$_2$FeAl$_{0.5}$Si$_{0.5}$ and Sr$_2$FeMoO$_6$ films using a double modulation technique

TL;DR

This paper introduces a novel cantilever-based ferromagnetic resonance detection method capable of high-frequency measurements on thin films, revealing complex magnetization dynamics not explained by conventional models.

Contribution

The study presents a new FMR detection technique using a commercial piezo-cantilever, enabling measurements up to 160 GHz on nanometer-thick films, and uncovers complex magnetization behaviors in these materials.

Findings

Successful detection of FMR in thin films using cantilever setup.

Identification of complex magnetization dynamics in Sr₂FeMoO₆.

Observation of increased linewidths and secondary resonance lines at high frequencies.

Abstract

In this work we introduce a new method of a ferromagnetic resonance (FMR) detection from thin, nm-size, films. Our setup is based on the commercial piezo-cantilever, used for atomic force microscopy. It has an option to rotate the sample in the magnetic field and it operates up to the high microwave frequencies of 160 GHz. Using our cantilever based FMR spectrometer we have investigated a set of samples, namely quasi-bulk and 84 nm film Co$_2$FeAl$_{0.5}$Si$_{0.5}$ samples, 16 nm Fe$_{50}$Ni$_{50}$ film and 150 nm Sr$_2$FeMoO$_6$ film. The high frequency ferromagnetic resonance (FMR) response from an extremely thin Fe$_{50}$Ni$_{50}$ film we have fitted with the conventional model for the magnetization dynamics. The cantilever detected FMR experiments on Sr$_2$FeMoO$_6$ film reveal an inability of the conventional model to fit frequency and angular dependences with the same set of parameters, which suggests that one has to take into account much more complicated nature of the magnetization precession in the Sr$_2$FeMoO$_6$ at low temperatures and high frequencies. Moreover, the complicated dynamics of the magnetization apparent in all investigated samples is suggested by a drastic increase of the linewidths with increasing microwave frequency, and by an emergence of the second line with an opposite angular dependence.