Performance Analysis of uniaxially strained Monolayer Black Phosphorus and Blue Phosphorus n-MOSFET and p-MOSFET

TL;DR

This study computationally investigates how uniaxial strain affects the electronic properties and device performance of monolayer black and blue phosphorus-based MOSFETs, revealing blue P's higher strain sensitivity and performance improvements.

Contribution

It provides a detailed computational analysis of strain effects on black and blue phosphorus MOSFETs, highlighting blue P's greater responsiveness and potential for performance enhancement.

Findings

Blue P's carrier effective masses are highly strain-sensitive.

Blue P MOSFETs show significant performance improvements under strain.

Black P MOSFETs have moderate or limited strain-induced performance changes.

Abstract

In this work, we present a computational study on the possibility of strain engineering in monolayer Black Phosphorus (black P) and Blue Phosphorus (blue P) based MOSFETs. The material properties like band structure, carrier effective masses, carrier densities at band extrema are evaluated using Generalized Gradient Approximation (GGA) in Density Functional Theory (DFT).Thereafter self-consistent Non-Equilibrium Greens Function (NEGF) simulations are carried out to study the device performance metrics (such as output characteristics, ON currents, transconductance etc.) of such strained black P and blue P based MOSFETs. Our simulations show that carrier effective masses in blue P are more sensitive to strain applied in both zigzag and armchair directions. Blue P is more responsive in strain engineering for n-MOS and p-MOS. Except for black P based FETs with strain in armchair direction, overall the blue P (black P) n-MOSFET (p-MOSFET) show moderate to significant improvement in performance with tensile (compressive) strain in the transport directions.