A New Model For Incorporating the Variations of the Dielectric Permittivity of the Medium: Part (1)Potential Distribution of an Electrical Double Layer in Rectangular Nano channel by Applying Finite Element Method Technique

TL;DR

This paper introduces a finite element method-based model to analyze the potential distribution of the electrical double layer in rectangular nanochannels, emphasizing the impact of dielectric permittivity variations in electrolytic media.

Contribution

It presents a novel mathematical model incorporating dielectric permittivity variations into the EDL analysis in nanochannels, which was previously underexplored.

Findings

Model effectively captures dielectric permittivity effects on EDL potential distribution

Finite element method provides accurate solutions for nanochannel EDL problems

Highlights importance of dielectric correction in chemical and biomedical applications

Abstract

The effect of the dielectric permittivity of the electrolytic medium in the Electrical Double Layer (EDL) in Nanochannel is an important factor that requires a correction, before the application of the model in various chemical and biomedical examinations. However very few efforts are put forth to accommodate this into the mathematics of the EDL Models developed hitherto, even though it was realized by a host of authors for the past half a century or even more. Most of the Nanoc hannel made lab-on-chips in a rectangular cross section require suitable impregnation of this. The effect of the EDL in a nanochannel isimportant in various chemical and biomedical examinations. Most of the nanochannelmadelab on chips in a rectangular cross section. The EDL insuch a nanochannel is governed by two dimensional Gouy Chapman (GC)equation.