Far infrared and terahertz spectroscopy of ferroelectric soft modes in thin films: A review

TL;DR

This review discusses how far-infrared and terahertz spectroscopy reveal soft mode behaviors in ferroelectric thin films, highlighting differences from bulk materials and the technique's sensitivity to film quality.

Contribution

It provides a comprehensive overview of soft mode spectroscopy in ferroelectric thin films, emphasizing effects of strain, depolarizing fields, and film quality assessment.

Findings

Soft-mode behavior differs between thin films and bulk materials.

Strain and depolarizing fields significantly influence soft modes.

Spectroscopy effectively assesses thin film quality.

Abstract

Far-infrared and terahertz spectroscopy of ferroelectric soft and central modes in thin films on substrates is reviewed. In addition to classical displacive proper ferroelectrics, also incipient and relaxor ferroelectrics and multiferroics are discussed. Special attention is paid to differences between the soft-mode behavior in thin films and bulk materials (ceramics and single crystals) and their influence on the low-frequency permittivity. Particularly the effects of the thin film strains and depolarizing electric fields of the probing waves on the grain boundaries are emphasized. The soft-mode spectroscopy is shown to be a very sensitive tool to reveal the thin film quality.