Extended formalism for simulating compound refractive lens-based x-ray microscopes
Hugh Simons, Sonja Rosenlund Ahl, Henning Friis Poulsen, Carsten, Detlefs

TL;DR
This paper introduces an advanced formalism for simulating and optimizing compound refractive lens-based x-ray microscopes, incorporating attenuation effects and providing analytical expressions for key imaging parameters.
Contribution
It extends ray transfer matrix analysis to include x-ray attenuation, offering a comprehensive tool for lens simulation and optimization in various imaging setups.
Findings
Analytical expressions for numerical aperture, vignetting, chromatic aberration, and focal length.
Applicable to both thin- and thick-lens geometries.
Enhanced simulation accuracy for CRL-based x-ray microscopy.
Abstract
We present a comprehensive formalism for the simulation and optimisation of CRLs in both condensing and full-field imaging configurations. The approach extends ray transfer matrix analysis to account for x-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, vignetting, chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries.
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Electron Microscopy Techniques and Applications
