Layer-dependent anisotropic electronic structure of freestanding quasi-two-dimensional MoS$_2$
Jinhua Hong, Kun Li, Chuanhong Jin, Xixiang Zhang, Ze Zhang, Jun, Yuan

TL;DR
This study investigates how the anisotropic electronic transitions in freestanding MoS$_2$ layers depend on layer thickness, revealing layer-dependent optical gaps and the three-dimensional nature of certain electronic states.
Contribution
It provides the first experimental analysis of layer-dependent anisotropic electronic transitions in freestanding MoS$_2$, highlighting the differences between monolayer and multilayer systems.
Findings
Direct gap at 1.8 eV is excited by in-plane polarization.
Out-of-plane optical gap is 2.4±0.2 eV in monolayer MoS$_2$.
Indirect transition shows a three-dimensional-like character.
Abstract
The anisotropy of the electronic transition is a well-known characteristic of low-dimensional transition-metal dichalcogenides, but their layer-thickness dependence has not been properly in- vestigated experimentally until now. Yet, it not only determines the optical properties of these low-dimensional materials, but also holds the key in revealing the underlying character of the elec- tronic states involved. Here we used both angle-resolved electron energy-loss spectroscopy and spectral analysis of angle-integrated spectra to study the evolution of the anisotropic electronic transition involving the low energy valence electrons in the freestanding MoS layers with different thicknesses. We are able to demonstrate that the well-known direct gap at 1.8 eV is only excited by the in-plane polarized field while the out-of-plane polarized optical gap is 2.40.2 eV in monolayer…
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