Picosecond electric-field-induced threshold switching in phase-change materials
Peter Zalden, Michael J. Shu, Frank Chen, Xiaoxi Wu, Yi Zhu, Haidan, Wen, Scott Johnston, Zhi-Xun Shen, Patrick Landreman, Mark Brongersma, Scott, W. Fong, H.-S. Philip Wong, Meng-Ju Sher, Peter Jost, Matthias Kaes, Martin, Salinga, Alexander von Hoegen, Matthias Wuttig

TL;DR
This paper demonstrates that threshold switching in phase-change materials can occur within sub-picosecond electric pulses, supporting electronic models and enabling ultrafast switching applications.
Contribution
It provides experimental evidence that threshold switching can happen on sub-picosecond timescales, favoring electronic over nucleation models.
Findings
Threshold switching occurs within sub-picosecond electric pulses.
Reversible conductivity changes are observed under electric field.
Potential for ultrafast electronic switching applications.
Abstract
Many chalcogenide glasses undergo a breakdown in electronic resistance above a critical field strength. Known as threshold switching, this mechanism enables field-induced crystallization in emerging phase-change memory. Purely electronic as well as crystal nucleation assisted models have been employed to explain the electronic breakdown. Here, picosecond electric pulses are used to excite amorphous AgInSbTe. Field-dependent reversible changes in conductivity and pulse-driven crystallization are observed. The present results show that threshold switching can take place within the electric pulse on sub-picosecond time-scales - faster than crystals can nucleate. This supports purely electronic models of threshold switching and reveals potential applications as an ultrafast electronic switch.
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