A New Approach for Testing Properties of Discrete Distributions
Ilias Diakonikolas, Daniel M. Kane

TL;DR
This paper introduces a unified, modular approach for distribution testing that achieves sample-optimal algorithms for a wide range of problems, simplifying analysis and extending to new metrics.
Contribution
It presents a novel reduction-based framework that yields the first sample-optimal testers for many distribution testing problems and simplifies existing estimators.
Findings
Achieves sample-optimal testers for identity, closeness, independence, and histogram testing.
Provides the first nearly instance-optimal algorithm for testing distribution equivalence.
Introduces a new information-theoretic lower bound technique for distribution property testing.
Abstract
In this work, we give a novel general approach for distribution testing. We describe two techniques: our first technique gives sample-optimal testers, while our second technique gives matching sample lower bounds. As a consequence, we resolve the sample complexity of a wide variety of testing problems. Our upper bounds are obtained via a modular reduction-based approach. Our approach yields optimal testers for numerous problems by using a standard -identity tester as a black-box. Using this recipe, we obtain simple estimators for a wide range of problems, encompassing most problems previously studied in the TCS literature, namely: (1) identity testing to a fixed distribution, (2) closeness testing between two unknown distributions (with equal/unequal sample sizes), (3) independence testing (in any number of dimensions), (4) closeness testing for collections of distributions,…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
