Fluctuations of Entropy Production in Partially Masked Electric Circuits: Theoretical Analysis
K.-H. Chiang, C.-W. Chou, C.-L. Lee, P.-Y. Lai, Y.-F. Chen

TL;DR
This paper provides a theoretical analysis of entropy production fluctuations in partially masked RC circuits with thermal noise, deriving key statistical properties and testing the fluctuation theorem's validity under different conditions.
Contribution
It introduces a comprehensive theoretical framework for analyzing entropy fluctuations in coupled RC circuits with thermal noise, including derivations of correlation functions and validation of the fluctuation theorem.
Findings
Derived time-correlation functions and steady-state distributions.
Validated the fluctuation theorem for complete and incomplete descriptions.
Provided insights into entropy production in noisy electrical circuits.
Abstract
In this work we perform theoretical analysis about a coupled RC circuit with constant driven currents. Starting from stochastic differential equations, where voltages are subject to thermal noises, we derive time-correlation functions, steady-state distributions and transition probabilities of the system. The validity of the fluctuation theorem (FT) is examined for scenarios with complete and incomplete descriptions.
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