Understanding the interaction between energetic ions and freestanding graphene towards practical 2D perforation
Jakob Buchheim, Roman M. Wyss, Ivan Shorubalko, Hyung Gyu Park

TL;DR
This study investigates how energetic ions interact with freestanding graphene, revealing species-dependent sputtering effects and enabling precise nanometer-scale patterning for device fabrication.
Contribution
It provides experimental and theoretical insights into ion-graphene interactions, demonstrating controlled patterning of sub-5 nm pores using focused ion beam technology.
Findings
He+ ions pass through graphene with minimal damage at high energies
Ga+ ions cause significant sputtering and defect formation
Binary collision theory accurately models ion interactions with graphene
Abstract
We report experimentally and theoretically the behavior of freestanding graphene subject to bombardment of energetic ions, investigating the ability of large-scale patterning of freestanding graphene with nanometer sized features by focused ion beam technology. A precise control over the He+ and Ga+ irradiation offered by focused ion beam techniques enables to investigate the interaction of the energetic particles and graphene suspended with no support and allows determining sputter yields of the 2D lattice. We find strong dependency of the 2D sputter yield on the species and kinetic energy of the incident ion beams. Freestanding graphene shows material semi-transparency to He+ at high energies (10-30 keV) allowing the passage of >97% He+ particles without creating destructive lattice vacancy. Large Ga+ ions (5-30 keV), in contrast, collide far more often with the graphene lattice to…
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