Raman Characterization of Platinum Diselenide Thin Films

TL;DR

This study demonstrates how Raman spectroscopy can effectively characterize the structural and vibrational properties of newly synthesized platinum diselenide (PtSe2) thin films, revealing thickness and wavelength-dependent features.

Contribution

It provides the first detailed Raman analysis of PtSe2 thin films, linking vibrational modes to film thickness and laser parameters, aiding future material characterization.

Findings

Raman active modes Eg and A1g identified in PtSe2 films.

Peak positions depend on film thickness and excitation wavelength.

Raman spectra match simulated phonon dispersion curves.

Abstract

Platinum diselenide (PtSe2) is a newly discovered 2D material which is of great interest for applications in electronics and catalysis. PtSe2 films were synthesized by thermally-assisted selenization of predeposited platinum films and scanning transmission electron microscopy revealed the crystal structure of these films to be 1T. Raman scattering of these films was studied as a function of film thickness, laser wavelength and laser polarization. Eg and A1g Raman active modes were identified using polarization measurements in the Raman setup. These modes were found to display a clear position and intensity dependence with film thickness, for multiple excitation wavelengths, and their peak positions agree with simulated phonon dispersion curves for PtSe2. These results highlight the practicality of using Raman spectroscopy as a prime characterization technique for newly-synthesized 2D materials.