Near-IR photoluminescence from Si/Ge nanowire grown silicon wafers: effect of HF treatment
Seref Kalem, Peter Werner, Vadim Talalaev

TL;DR
This study investigates how HF treatment enhances near-infrared photoluminescence in Si/Ge nanowire grown silicon wafers by modifying surface defects and inducing carrier confinement, with potential optoelectronic applications.
Contribution
It demonstrates that HF treatment significantly enhances and tunes NIR PL in Si/Ge nanowire wafers by surface modification and defect control, a novel approach for optoelectronic device development.
Findings
Enhanced NIR PL intensity after HF treatment.
Surface etching and oxidation modify defect sites and induce carrier confinement.
Balance between silicon band-edge emission and defect-related deep-level emission.
Abstract
We present the room temperature (RT) near-infrared (NIR) photoluminescence (PL) properties of Si/Ge nanowire (NW) grown silicon wafers which were treated by vapor of HF:HNO3 chemical mixture. This treatment activates or enhances the PL intensity at NIR region ranging from 1000 nm to 1800 nm. The PL consists of a silicon band-edge emission and a broad composite band which was centered at around 1400-1600 nm. The treatment modifies the wafer surface particularly at defect sites particularly pits around NWs and NW surfaces by etching and oxidation of Si and Ge. This process can induce spatial confinement of carriers where band-to-band (BB) emission is the dominant property in Si capped strained Si/Ge NW grown wafers. Strong signals were observed at sub-band gap energies in Ge capped Si/Ge NW grown wafers. It was found that NIR PL is a competitive property between the Si BB transition and…
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