Swift Heavy Ion Irradiation Induced Modifications in Structural, Microstructural, Electrical and Magnetic Properties of Mn Doped $SnO_{2}$ Thin Films

TL;DR

This study investigates how swift heavy ion irradiation alters the structural, microstructural, electrical, and magnetic properties of Mn-doped SnO2 thin films, revealing defect-related modifications and their implications.

Contribution

It provides a comprehensive analysis of defect-induced property changes in Mn-doped SnO2 thin films under heavy ion irradiation, combining experimental and theoretical insights.

Findings

Ion irradiation modifies structural and electrical properties.

Magnetic and morphological changes are linked to defect conductivity.

Correlation between experimental and theoretical defect properties is established.

Abstract

In this paper, we have presented the impact of swift heavy ion beam irradiation on the structural, microstructural, electrical and magnetic properties of $Sn_{0.9}Mn_{0.1}O_{2}$ thin films. The structural and electrical results have been interpreted by using properties of native or point defects, whereas the magnetic and morphological variations have been explained in terms of conductivity of material. Efforts have been made to summarize the properties of all possible charged and neutral point defects ($V_{Sn}^{4-}$, $Sn_{i}^{4+}$, $V_{O}^{0}$, $O_{i}^{2-}$, $Sn_{O}^{4+}$, $O_{Sn}^{2-}$, $H_{O}^{+}$) and afterwards from the correlation between experimentally-observed and theoretically-calculated results various interesting conclusions have been drawn.