The peculiarities of distributions of overfocused sputtered atoms ejected from (001) Ni with energy and angular resolution

TL;DR

This study uses molecular dynamics simulations to analyze the azimuthal-angle overfocusing of sputtered atoms from Ni (001), revealing multi-valued signals and distinct maxima that can be experimentally detected.

Contribution

It provides new insights into the mechanisms of overfocusing in sputtered atoms and demonstrates the potential for experimental separation of overfocused atoms.

Findings

Overfocused atoms exhibit multi-valued azimuthal-angle signals.

Distinct maxima of overfocused atoms can be detected separately.

Overfocusing mechanisms are elucidated through simulation.

Abstract

The features of the azimuthal-angle overfocusing of atoms sputtered from the surface of the Ni (001) face are studied by molecular dynamics computer simulation. The signal of overfocused atoms is found to be multi-valued with respect to the initial azimuthal angle due to different mechanisms of scattering. The overfocused atoms form separate maximum and can be detected in experiments with angle and energy resolution separately from the focused and the own atoms.