A hard X-ray view of the soft excess in AGN
Rozenn Boissay, Claudio Ricci, St\'ephane Paltani

TL;DR
This study analyzes X-ray data from 102 Seyfert 1 galaxies to determine the origin of the soft excess, favoring warm Comptonization over ionized reflection based on spectral analysis and model comparisons.
Contribution
It provides a comprehensive spectral analysis of Seyfert 1s using Swift/BAT and XMM-Newton data, testing models for the soft excess and favoring warm Comptonization.
Findings
Soft excess present in about 80% of the sample.
Soft-excess strength positively correlates with Eddington ratio.
Ionized reflection models are inconsistent with observed spectral behavior.
Abstract
An excess of X-ray emission below 1 keV, called soft excess, is detected in a large fraction of Seyfert 1-1.5s. The origin of this feature remains debated, as several models have been suggested to explain it, including warm Comptonization and blurred ionized reflection. In order to constrain the origin of this component, we exploit the different behaviors of these models above 10 keV. Ionized reflection covers a broad energy range, from the soft X-rays to the hard X-rays, while Comptonization drops very quickly in the soft X-rays. We present here the results of a study done on 102 Seyfert 1s (Sy 1.0, 1.2, 1.5 and NLSy1) from the Swift/BAT 70-Month Hard X-ray Survey catalog. The joint spectral analysis of Swift/BAT and XMM-Newton data allows a hard X-ray view of the soft excess that is present in about 80% of the objects of our sample. We discuss how the soft-excess strength is linked to…
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