Reciprocal Space Mapping for Dummies
Samuele Lilliu, Thomas Dane

TL;DR
This paper provides a clear, rigorous derivation of reciprocal space mapping equations for GIXD, enabling better analysis of diffraction data in surface-sensitive X-ray experiments across various materials.
Contribution
It introduces an accessible derivation of reciprocal space mapping equations for 3D+1S diffractometers, aiding researchers in analyzing GIXD data.
Findings
Derived reciprocal space mapping equations for 3D+1S diffractometers
Clarified the geometric and algebraic basis of GIXD data analysis
Enhanced understanding of diffraction pattern interpretation
Abstract
Grazing Incidence X-ray Diffraction (GIXD) is a surface sensitive X-ray investigation technique (or geometry configuration) that can reveal the structural properties of a film deposited on a flat substrate. The term grazing indicates that the angle between the incident beam and the film is small (typically below 0.5 degrees). This essential technique has been employed on liquid crystals, nanoparticles and colloids, nanostructures, corrosion processes, polymers, bio-materials, interfaces, materials for solar cells, photodiodes, and transistors, etc. Diffraction patterns in GIXD geometry are typically captured with a 2D detector, which outputs images in pixel coordinates. A step required to perform analyses such as grain size estimation, disorder, preferred orientation, quantitative phase analysis of the probed film surface, etc., consists in converting the diffraction image from pixel…
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Taxonomy
TopicsX-ray Diffraction in Crystallography · Force Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
