The lifetime of the bound excited level in Ni$^-$
M. Kami\'nska, V. T. Davis, O. M. Hole, R. F. Nascimento, K. C., Chartakunchand, M. Blom, M. Bj\"orkhage, A. K\"allberg, P. L\"ofgren, P., Reinhed, S. Ros\'en, A. Simonsson, R. D. Thomas, S. Mannervik, P. A. Neill,, J. S. Thompson, H. T. Schmidt, H. Cederquist, D. Hanstorp

TL;DR
This paper reports a precise measurement of the intrinsic lifetime of an excited bound state in Ni$^-$ ions, using cryogenic ion storage rings, providing valuable data for understanding negative ion states.
Contribution
The study provides the first direct measurement of the intrinsic lifetime of the upper level in Ni$^-$, utilizing cryogenic storage ring techniques at DESIREE.
Findings
Intrinsic lifetime of Ni$^-$ upper level is 15.1 ± 0.4 seconds.
Ion storage lifetime at 13 K is approximately five minutes.
Cryogenic storage rings enable precise lifetime measurements of negative ions.
Abstract
The intrinsic lifetime of the upper level in the bound-bound 3d4s D 3d4s D radiative transition in Ni was measured to be 15.1 0.4 s. The experiment was performed at cryogenic temperatures in one of the ion-beam storage rings of the DESIREE (Double ElectroStatic Ion Ring Experiment) facility at Stockholm University. The storage lifetime of the Ni ion-beam was measured to be close to five minutes at a ring temperature of 13 K.
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