Selective observation of Goos-H\"anchen and Imbert-Federov shifts in partial reflection via optimized weak measurements in linear and elliptical polarization basis

TL;DR

This paper demonstrates how weak measurements can selectively amplify, decouple, and control the spatial and angular beam shifts (Goos-H"anchen and Imbert-Federov effects) during partial reflection, enhancing understanding and potential applications in sensing.

Contribution

The study introduces a method to decouple and amplify GH and IF beam shifts using optimized weak measurements with specific polarization pre- and post-selection.

Findings

Successful experimental decoupling of GH and IF shifts.

Amplification of beam shifts through weak measurement techniques.

Controlled manipulation of beam shifts for potential sensing applications.

Abstract

The spatial and the angular variants of the Goos-H\"anchen (GH) and the Imbert-Federov (IF) beam shifts contribute in a complex interrelated way to the resultant beam shift in partial reflection at planar dielectric interfaces. Here, we show that the angular GH and the two variants of the IF effects can be decoupled, amplified and separately observed by weak value amplification and subsequent conversion of spatial$\leftrightarrow$angular nature of the beam shifts using appropriate pre and post selection of polarization states. We experimentally demonstrate such decoupling and illustrate various other intriguing manifestations of weak measurements by employing optimized pre and post selections (based on the eigen polarization states of the shifts) elliptical and / or linear polarization basis. The demonstrated ability to amplify, controllably decouple or combine the beam shifts via weak measurements may prove to be valuable for understanding the different physical contributions of the effects and for their applications in sensing and precision metrology