Stochastic stimulated electronic x-ray Raman spectroscopy
Victor Kimberg, Nina Rohringer

TL;DR
This paper introduces a stochastic spectroscopy method for high-resolution stimulated resonant inelastic x-ray scattering (RIXS) using the full bandwidth of XFEL pulses, enabling ultrafast chemical and structural studies.
Contribution
It proposes a novel stochastic RIXS approach that leverages the entire XFEL bandwidth and covariance analysis for improved spectral resolution and feasibility at realistic experimental conditions.
Findings
Feasibility demonstrated for CO molecule at specific transitions
Predicted signal strengths for realistic XFEL parameters
Theoretical model describes spectral and temporal evolution
Abstract
Resonant inelastic x-ray scattering (RIXS) is a well-established tool for studying electronic, nuclear and collective dynamics of excited atoms, molecules and solids. An extension of this powerful method to a time-resolved probe technique at x-ray free electron lasers (XFELs) to ultimately unravel ultrafast chemical and structural changes on a femtosecond time scale is often challenging, due to the small signal rate in conventional implementations at XFELs that rely on the usage of a monochromator set up to select a small frequency band of the broadband, spectrally incoherent XFEL radiation. Here, we suggest an alternative approach, based on stochastic spectroscopy, that uses the full bandwidth of the incoming XFEL pulses. Our proposed method is relying on stimulated resonant inelastic x-ray scattering, where in addition to a pump pulse that resonantly excites the system a probe pulse…
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Spectroscopy and Quantum Chemical Studies · Advanced X-ray Imaging Techniques
