Mathematical framework for multi-frequency identification of thin insulating and small conductive inhomogeneities

TL;DR

This paper develops a mathematical framework for identifying thin insulating and small conductive inhomogeneities inside a conducting medium using multi-frequency electrical impedance tomography, with theoretical derivations and experimental validation.

Contribution

It introduces a rigorous potential analysis along inhomogeneities at multiple frequencies and combines PCA-based imaging for improved identification of different inhomogeneities.

Findings

Asymptotic formulas relate boundary potential to inhomogeneities.

Spectroscopic images visualize admittivity variations.

PCA-based integrated imaging enhances inhomogeneity detection.

Abstract

We are aiming to identify the thin insulating inhomogeneities and small conductive inhomogeneities inside an electrically conducting medium by using multi-frequency electrical impedance tomography (mfEIT). The thin insulating inhomogeneities are considered in the form of tubular neighborhood of a curve and small conductive inhomogeneities are regarded as circular disks. Taking advantage of the frequency dependent behavior of insulating objects, we give a rigorous derivation of the potential along thin insulating objects at various frequencies. Asymptotic formula is given to analyze relationship between inhomogeneities and boundary potential at different frequencies. In numerical simulations, spectroscopic images are provided to visualize the reconstructed admittivity at various frequencies. For the view of both kinds of inhomogeneities, an integrated reconstructed image based on principle component analysis (PCA) is provided. Phantom experiments are performed by using Swisstom EIT-Pioneer Set.