Bayesian Redshift Classification of Emission-line Galaxies with Photometric Equivalent Widths

TL;DR

This paper introduces a Bayesian method for classifying emission-line galaxies as high-redshift Lyman-alpha emitters using only a single detected emission line, improving accuracy over traditional equivalent width cuts.

Contribution

The paper presents a Bayesian classification approach that utilizes prior distributions and observed properties to more accurately identify LAEs, outperforming traditional methods in simulated surveys.

Findings

Recover 86% of LAEs missed by traditional EW cut

Reduces uncertainty in cosmological distance measurements by 14%

Enables probabilistic classification for large-scale structure analysis

Abstract

We present a Bayesian approach to the redshift classification of emission-line galaxies when only a single emission line is detected spectroscopically. We consider the case of surveys for high-redshift Lyman-alpha-emitting galaxies (LAEs), which have traditionally been classified via an inferred rest-frame equivalent width (EW) greater than 20 angstrom. Our Bayesian method relies on known prior probabilities in measured emission-line luminosity functions and equivalent width distributions for the galaxy populations, and returns the probability that an object in question is an LAE given the characteristics observed. This approach will be directly relevant for the Hobby-Eberly Telescope Dark Energy Experiment (HETDEX), which seeks to classify ~10^6 emission-line galaxies into LAEs and low-redshift [O II] emitters. For a simulated HETDEX catalog with realistic measurement noise, our Bayesian method recovers 86% of LAEs missed by the traditional EW > 20 angstrom cutoff over 2 < z < 3, outperforming the EW cut in both contamination and incompleteness. This is due to the method's ability to trade off between the two types of binary classification error by adjusting the stringency of the probability requirement for classifying an observed object as an LAE. In our simulations of HETDEX, this method reduces the uncertainty in cosmological distance measurements by 14% with respect to the EW cut, equivalent to recovering 29% more cosmological information. Rather than using binary object labels, this method enables the use of classification probabilities in large-scale structure analyses. It can be applied to narrowband emission-line surveys as well as upcoming large spectroscopic surveys including Euclid and WFIRST.