Optical properties of PZT thin films deposited on a ZnO buffer layer

TL;DR

This study investigates the optical properties of PZT thin films on ZnO layers using m-lines spectroscopy, developing a numerical algorithm to analyze the layered system and relate structural changes to optical measurements.

Contribution

A novel numerical algorithm for analyzing two-layer optical systems from m-lines spectra, demonstrating robustness and sensitivity to structural changes.

Findings

Successful retrieval of refractive index and thickness of PZT and ZnO layers

Algorithm remains robust in noisy conditions

Observed refractive index changes linked to PZT structural modifications

Abstract

The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thickness of both layers from the m-lines spectra, we develop a numerical algorithm for the case of a two-layer system and show its robustness in the presence of noise. The sensitivity of the algorithm of the two-layer model allows us to relate the observed changes in the PZT refractive index to the PZT structural change due to the ZnO interface of the PZT/ZnO optical waveguide.