Time-resolved electron beam diagnostics with sub-femtosecond resolution

TL;DR

This paper proposes a novel method using transverse gradient fields to enhance the temporal resolution of electron beam diagnostics in free-electron lasers, achieving sub-femtosecond precision.

Contribution

It introduces a transverse gradient undulator to compensate for beam size limitations, enabling sub-femtosecond resolution in electron beam diagnostics.

Findings

Achieved theoretical resolution below 1 femtosecond RMS.

Demonstrated potential for precise measurement of electron bunch profiles.

Enhanced diagnostic capabilities for ultra-fast photon pulse generation.

Abstract

In modern high-gain free-electron lasers, ultra-fast photon pulses designed for studying chemical, atomic and biological systems are generated from a serial of behaviors of high-brightness electron beam at the time-scale ranging from several hundred femtoseconds to sub-femtosecond. Currently, radiofrequency transverse deflectors are widely used to provide reliable, single-shot electron beam phase space diagnostics, with a temporal resolution of femtosecond. Here, we show that the time resolution limitations caused by the intrinsic beam size in transverse deflectors, can be compensated with specific transverse-to-longitudinal coupling elements. For the purpose, an undulator with transverse gradient field is introduced before the transverse deflector. With this technique, a resolution of less than 1fs root mean square has been theoretically demonstrated for measuring the longitudinal profile and/or the micro-bunching of the electron bunch.