Analysis of thermal radiation in ion traps for optical frequency standards
Miroslav Dole\v{z}al, Petr Balling, Peter B R Nisbet-Jones, Steven A, King, Jonathan M Jones, Hugh A Klein, Patrick Gill, Thomas Lindvall, Anders E, Wallin, Mikko Merimaa, Christian Tamm, Christian Sanner, Nils Huntemann, Nils, Scharnhorst, Ian D Leroux, Piet O Schmidt

TL;DR
This paper analyzes the thermal radiation effects in ion traps used for optical frequency standards, developing models to predict temperature rises and their impact on clock accuracy, with implications for trap design and uncertainty reduction.
Contribution
It introduces finite element models for various ion trap designs to accurately predict thermal radiation effects and improve the precision of optical frequency standards.
Findings
Effective temperature rises range from 0.8 K to 2.1 K.
Frequency shift uncertainties are around 10^-18 for certain ion transitions.
Design recommendations were developed to mitigate heating issues.
Abstract
In many of the high-precision optical frequency standards with trapped atoms or ions that are under development to date, the AC Stark shift induced by thermal radiation leads to a major contribution to the systematic uncertainty. We present an analysis of the inhomogeneous thermal environment experienced by ions in various types of ion traps. Finite element models which allow the determination of the temperature of the trap structure and the temperature of the radiation were developed for 5 ion trap designs, including operational traps at PTB and NPL and further optimized designs. Models were refined based on comparison with infrared camera measurement until an agreement of better than 10% of the measured temperature rise at critical test points was reached. The effective temperature rises of the radiation seen by the ion range from 0.8 K to 2.1 K at standard working conditions. The…
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