Integrated Plasmonic Metasurfaces for Spectropolarimetry

TL;DR

This paper presents a compact, chip-scale spectropolarimeter using integrated plasmonic metasurfaces capable of simultaneous spectral and polarization measurements with high accuracy over 500-700 nm.

Contribution

The authors introduce a novel integrated plasmonic metasurface device that enables simultaneous spectral and polarization analysis on a chip-scale platform.

Findings

Achieved good spectral resolution and polarization accuracy from 500-700 nm.

Demonstrated device functionality in Mueller matrix measurements.

Fabricated the device with a single photolithography step.

Abstract

Plasmonic metasurfaces enable simultaneous control of the phase, momentum, amplitude and polarisation of light and hence promise great utility in realisation of compact photonic devices. In this paper, we demonstrate a novel chip-scale device suitable for simultaneous polarisation and spectral measurements through use of six integrated plasmonic metasurfaces (IPMs), which diffract light with a given polarisation state and spectral component into well-defined spatial domains. Full calibration and characterisation of our device is presented, whereby good spectral resolution and polarisation accuracy over a wavelength range of 500-700~nm is shown. Functionality of our device in a M\"uller matrix modality is demonstrated through determination of the polarisation properties of a commercially available variable waveplate. Our proposed IPM is robust, compact and can be fabricated with a single photolithography step, promising many applications in polarisation imaging, quantum communication and quantitative sensing.