LayerOptics: Microscopic modeling of optical coefficients in layered materials
Christian Vorwerk, Caterina Cocchi, Claudia Draxl

TL;DR
LayerOptics is a computational tool that accurately models optical coefficients in layered anisotropic materials by solving Maxwell's equations, bridging the gap between first-principles calculations and experimental measurements.
Contribution
We introduce LayerOptics, a new implementation that computes optical coefficients from dielectric tensors considering anisotropy, enhancing the microscopic understanding of spectroscopic properties.
Findings
Good agreement with experimental data across frequency ranges
Highlights the importance of combining ab initio methods with Maxwell's equations
Demonstrates applicability to complex layered materials
Abstract
Theoretical spectroscopy is a powerful tool to describe and predict optical properties of materials. While nowadays routinely performed, first-principles calculations only provide bulk dielectric tensors in Cartesian coordinates. These outputs are hardly comparable with experimental data, which are typically given by macroscopic quantities, crucially depending on the laboratory setup. Even more serious discrepancies can arise for anisotropic materials, e.g., organic crystals, where off-diagonal elements of the dielectric tensor can significantly contribute to the spectral features. Here, we present LayerOptics, a versatile and user-friendly implementation, based on the solution of the Maxwell's equations for anisotropic materials, to compute optical coefficients in anisotropic layered materials. We apply this tool for post-processing full dielectric tensors of molecular materials,…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
