Estimation of intrinsic diffusion coefficients in a pseudo-binary diffusion couple

TL;DR

This paper introduces a generalized method using pseudo-binary approach to estimate intrinsic diffusion coefficients in multi-component systems, demonstrated through experiments on Cu-based solid solutions.

Contribution

It develops a new generalized technique for determining intrinsic diffusion coefficients in multi-component systems using pseudo-binary approach.

Findings

Successful estimation of diffusion coefficients in Cu(Sn, Ga) and Cu(Sn, Si) systems

Validation of the pseudo-binary approach with experimental diffusion profiles

Enhanced understanding of diffusion behavior in multi-component alloys

Abstract

Major drawback of studying diffusion in multi-component systems is the lack of suitable techniques to estimate the diffusion parameters. In this study, a generalized treatment to determine the intrinsic diffusion coefficients in multi-component systems is developed utilizing the concept of pseudo-binary approach. This is explained with the help of experimentally developed diffusion profiles in the Cu(Sn, Ga) and Cu(Sn, Si) solid solutions.