High-Performance Monolayer WS2 Field-effect Transistors on High-k Dielectrics
Yang Cui, Run Xin, Zhihao Yu, Yiming Pan, Zhun-Yong Ong, Xiaoxu Wei,, Junzhuan Wang, Haiyan Nan, Zhenhua Ni, Yun Wu, Tangsheng Chen, Yi Shi,, Baigeng Wang, Gang Zhang, Yong-Wei Zhang, Xinran Wang

TL;DR
This paper demonstrates high-performance monolayer WS2 transistors achieved through high-k dielectric and passivation, resulting in record mobility and a transition to metallic conduction, supported by a theoretical transport model.
Contribution
It introduces a novel combination of dielectric and passivation techniques to significantly enhance WS2 transistor mobility and provides a theoretical model for electron transport.
Findings
Record high mobility of 83 cm2/Vs at room temperature
Transition from insulating to metallic charge transport
Development of a theoretical electron transport model
Abstract
The combination of high-quality Al2O3 dielectric and thiol chemistry passivation can effectively reduce the density of interface traps and Coulomb impurities of WS2, leading to a significant improvement of the mobility and a transition of the charge transport from the insulating to the metallic regime. A record high mobility of 83 cm2/Vs (337 cm2/Vs) is reached at room temperature (low temperature) for monolayer WS2. A theoretical model for electron transport is also developed.
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