Commentary on the Interpretation of Fourier-Transform Scanning Tunneling Microscopy Data

TL;DR

This paper critically examines common pitfalls and misconceptions in Fourier-transform scanning tunneling microscopy data analysis, emphasizing the need for careful interpretation and proper methodology, especially in studies of topological insulators.

Contribution

It highlights overlooked issues in FT-STM data processing, critiques symmetry enhancement practices, and proposes alternative analysis techniques for more accurate interpretation.

Findings

Symmetry enhancements can mislead data interpretation.

Data processing steps are often insufficiently described.

Alternative analysis methods can improve data accuracy.

Abstract

Several papers have been published recently, particularly in the field of topological insulators, that use a Fourier-transform technique in a way that can be misleading or otherwise inaccurate, and the processing is not always described in the Methods or Supplementary sections. This manuscript describes subtle issues with the technique that have been overlooked in several high-visibility papers. For instance, many authors make strong arguments regarding the importance of symmetries and asymmetries in their data, then enhance the symmetry in their data without accounting for their data processing steps. A brief analysis of the validity of FT-STM data symmetrization is provided, alternative analysis techniques are described, and some often overlooked concerns related to the scattering centers are described.